ALVTechnologies Philippines Incorporated, together with our manufacturer from Oxford Instruments Asylum Research, would like to invite you to join our webinar on the topic of Moiré Characterization of Twisted 2D Materials by AFM on November 14, 2024, 12:00 AM (Philippine Time).
Designed to probe surfaces at the nanoscale in ambient conditions, AFM is a near-perfect tool for providing quick characterization of moiré superlattices in van der Waals heterostructures, such as twisted bilayer graphene. Moiré has been observed with a variety of AFM modalities, including piezoresponse force microscopy (PFM), lateral force microscopy (LFM), conductive AFM, kelvin probe force microscopy (KPFM), torsional force microscopy (TFM), and contact mode.
We will look at examples of moiré imaging from a variety of AFM techniques, discuss the relative benefits and tradeoffs of each of these, and provide some practical imaging advice. Additionally, whether the moiré pattern is straightforward and easy to observe depends not only on the imaging technique and settings used, but also on the AFM itself. With moiré contrast stemming mostly from relatively small signals, the lower the AFM’s noise floor and susceptibility to environmental noise, the easier the moiré will be to image.
In this webinar, you will learn:
- Overview of AFM modes that are typically used to study twisted 2D materials
- The advantages and disadvantages of these modes for imaging moiré
Speaker
Jason Li has more than two decades of AFM expertise and graduated from Stanford University with undergraduate and graduate degrees in Mechanical Engineering and Materials Science and Engineering, respectively. He joined Asylum Research more than 20 years ago and has been involved with many aspects of the business throughout his career.
To register, visit the following link: Webinar Registration
We hope to see you online!